Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

O

Ogushi, Koji, National Metrology Institute of Japan (NMIJ), AIST, Tsukuba, Jepang
Oktora, Devic, Center For Material and Technical Products - Ministry of Industry