Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry
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Copyright © 2015 Jurnal Instrumentasi (p-ISSN:
0125-9202
, e-ISSN:
2460-1462
). All Rights Reserved.
This work is licensed under a
Creative Commons Attribution-NonCommercial 4.0 International License
.