Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Statistics

Year

<< 2023 >>

Issues published 1
Items published 9
Total submissions 13
Peer reviewed 10
  Accept 8 (80%)
  Decline 2 (20%)
  Days to review 121
  Days to publication 245
Registered users 746 (113 new)
Registered readers 688 (103 new)