Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Statistics

Year

<< 2020 >>

Issues published 2
Items published 27
Total submissions 32
Peer reviewed 29
  Accept 26 (90%)
  Decline 3 (10%)
  Days to review 175
  Days to publication 392
Registered users 517 (34 new)
Registered readers 483 (27 new)