Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Statistics

Year

<< 2018 >>

Issues published 4
Items published 24
Total submissions 40
Peer reviewed 30
  Accept 29 (97%)
  Decline 1 (3%)
  Days to review 75
  Days to publication 364
Registered users 129 (36 new)
Registered readers 104 (35 new)