Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Author Details

Samdara, Rida, Jurusan Fisika, FMIPA, Universitas Bengkulu, Indonesia

  • Vol 45, No 2 (2021) - Artikel
    STUDI RANDOM ERROR PADA PENGUKURAN MIKROTREMOR SERTA IMPLIKASINYA TERHADAP PERHITUNGAN Vs30 DAN KETEBALAN SEDIMEN
    Abstract  PDF