Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Vol 44, No 2 (2020)

Table of Contents

 
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iii-iv
Ninuk Ragil Prasasti, Denny Hermawanto
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103-112
Sensus Wijonarko, Tatik Maftukhah, Dadang Rustandi, Bernadus Sirenden, Mahmudi Mahmudi
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113-121
Lukluk Khairiyati, Hayati Amalia
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123-139
Asep Hapiddin, Yulita Ika Pawestri, A. M. Boynawan, Ratnaningsih Ratnaningsih
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141-153
Novrita Idayanti, N. Sudrajat, K. Kristiantoro, D. Mulyadi, I. Kurniawan, M. Nurdin, J. Nugraha
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155-167
Hafid Hafid, Dinar Nurcahyono, Renanta Hayu K, Zuhdi Ismail, Adindra Vickar Ega, Helmi Zaini, Hayati Amalia
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169-181
Adindra Vickar Ega, Gigin Ginanjar, Okasatria Novyanto, Dini Suryani
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183-197
Jalu Ahmada Prakosa, Bernadus H. Sirenden, Dadang Rustandi, Budi Kartiwa, Sensus Wijornako, Tatik Maftukhah, Purwowibowo Purwowibowo
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199-211