Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

T

Tistomo, Arfan Sindhu, Puslit KIM LIPI, Kompleks Puspiptek Serpong, Tangerang
Tistomo, Arfan Sindhu, Research Center for Metrology LIPI
Trisna, Beni Adi, Puslit Metrologi LIPI
TS, Andeka, Centre for Nuclear Facility Engineering – BATAN