Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Author Details

Prakosa, Jalu Ahmad, Pusat Penelitian Kalibrasi, Instrumentasi dan Metrologi (KIM) LIPI Kompleks Puspiptek Serpong, Tangerang, Banten 15314, Indonesia