Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

Author Details

Widarta, Anton, National Metrology Institute of Japan, Japan

  • Vol 42, No 2 (2018) - Artikel
    Precision RF/MW Measurement Techniques and Standards at NMIJ/AIST A BROADBAND ATTENUATION MEASUREMENT SYSTEM
    Abstract  PDF