Nanometrology, Optics and Laser-Based Measurements, Development of Measurement Standard, Measurement for Industrial Purposes, Measurement System Control Automation, Metrology in Chemistry

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Year

<< 2019

Issues published 0
Items published 0
Total submissions 5
Peer reviewed 0
  Accept 0 (0%)
  Decline 0 (0%)
  Days to review 47
  Days to publication 0
Registered users 488 (350 new)
Registered readers 450 (349 new)